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Scanner Calibration Grating 37 N/m depending on contact radius measured

SKU: 76921648172

4.5
EUR387.50 EUR415.50

Pay in 4 interest-free payments of $96.88 Learn more

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Ships within 48 hours · Estimated delivery Sep 7 - Sep 12

Description

depending on contact radius measured on a silver surface

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model FESP-V2

Bruker DDESP-V2 Electrical Probes

Tip Geometry: Rotated Tip Height: 3 - 8 Front Angle: 15 Back Angle: 1 - 24 Tip Radius (Nom): 1 Tip Radius (Max): 2 Tip Set Back (Nom): 3 Tip Set Back( RNG): 0-5

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-300

Scanner Calibration Grating 37 N/m depending on contact radius measuredDESCRIPTION Scanner Calibration Grating "Z Axis, 100 nm Z step height X & Y Axis, 5 m and 10 m pitch (6 shapes)"

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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