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This probe uses a rotated tip to provide a more symmetric representation of features over 200nm
CPII / Innova
Max OH = 30 nm
A pack of 10 High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes
the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
RFESPA-190 75 kHz This probe uses a rotated35N m, 190kHz, Symmetric Tip, Al Reflective Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to
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